Vernier Library

The Vernier Library is an open-source C++ library for pose measurement of calibrated patterns with subpixel resolutions.

The library gathers a collection of classes for detection and rendering different kind of calibrated patterns (periodic patterns, megarena patterns, QR-code-like and bitmap patterns).






Download


The library is open-source and can be downloaded on GitHub

The library is composed of two main complementary branches which are:

  • Pattern detection (pose measurement)
  • Pattern generation (image rendering, layout exporting)

Documentation


The documentation is automatically generated from the code using Doxygen.

Licence


The Vernier Library is Free Software in the technical sense defined by the Free Software Foundation, and is distributed under the terms of the GNU General Public License.

Non-free licenses are also available for companies that wish to use the Vernier library in their products but are unwilling to release their software under the GPL (which would require them to release source code and allow free redistribution). Contact us for more details: vernier@femto-st.fr

Acknowledgements


We kindly ask you to acknowledge this library in any program or publication in which you use it.

For general publications, we suggest referencing: Andre, A. N., Sandoz, P., Mauze, B., Jacquot, M., & Laurent, G. J. (2020). Sensing one nanometer over ten centimeters: A micro-encoded target for visual in-plane position measurement. IEEE/ASME Trans. Mechatronics.

If you like Vernier and want to help its development, you may contact our non-profit foundation FC-INNOV.

About


This library is named after the mathematician and inventor Pierre Vernier who was born in Ornans, Franche-Comté, France. He was the inventor and eponym of the vernier scale which increases the resolution of measuring devices like calipers and inspired us.

The Vernier Library has been written and maintained by researchers with the FEMTO-ST Institute located in Besançon, France.

Authors: Antoine N. André, Guillaume J. Laurent, Patrick Sandoz

Contact: vernier@femto-st.fr

Copyright (c) 2018 ENSMM, UFC, CNRS.