The MOEMS group will be attending the SPIE Photonics Europe at Brussels from 14th to 17th of April 2014 where several communications have been accepted:
“Arrays of millimeter-sized glass lenses for miniature inspection systems” by J. Albero, S. Perrin, S. Bargiel, M. Baranski, N. Passilly and C. Gorecki.
“Optical design of a Vertically Integrated Array-type Mirau-based OCT System”, by J. Krauter, T. Boettcher, W. Osten, W. Lyda, N. Passilly, L. Froehly, S. Bargiel, J. Albero, S. Perrin, J. Lullin and C. Gorecki.
“Metrology of micro optical components quality using direct measurement of 3D intensity point spread function”, by M. Baranski, S. Perrin, N. Passilly, L. Froehly, S. Bargiel, J. Albero, C. Gorecki.